Characterization of Nanofiltration Membrane Using Microscopic Methods

Surface properties of two nanofiltration membranes NF11 and NF12 were investigated using Atomic Force Microscope (AFM) and Scanning Electron Microscope (SEM) in conjunction with two image processing softwares (WSxM 5.0 Develop 6.4 and Image J) in order to predict the one which will give better performance in the treatment of waste water. Atomic Force Microscope Atomic Force Microscope of the unused membranes was used in conjunction with conjunction with WSxM 5.0 Develop 6.4 to study different surface roughness measures (Bearing ratio, Power Spectrum Density and Histogram). The membranes were scanned on two scan sizes (1.0 µm×1.0 µm and 5.0 µm×5.0 µm). Scanning Electron Microscope (SEM) in conjunction with Image J will be used to estimate the pore size of both the fresh and used membrane sample as we progress with the work.